книги / Микроструктуры интегральной электроники
..pdfР а зд е л |
III. СТРУКТУРЫ НА СВЕРХПРОВОДНИКАХ . . . . |
|
242 |
||||||
Глава 6. |
Структуры сверхпроводник-переходный слой-сверхпроводник |
|
242 |
||||||
61. |
2 |
Физика |
джозефсоновскси о |
перехода |
.................................... |
|
242 |
245 |
|
6 |
Процессы в переходе Джозефсона при воздействии магнитного поля |
||||||||
6 3. |
|
Эффект квантовой интерференции в структуре с переходами Джо |
249 |
||||||
6 |
4 |
зефсона . . . |
........................ |
. . . |
. |
||||
Токоперенос в переходе Джозефсона при воздействии электромаг |
250 |
||||||||
6 |
5. |
нитного |
поля Нестационарный эффект Джозефсона . . . . |
. |
|||||
Неравновесные явления при токоиереносе |
в СИС |
структуре . |
251 |
||||||
6 |
6. |
Явления в СПС структурах при токоиереносе.......................... |
|
259 |
|||||
67. |
|
Джозефсоновский ток в структуре С полупроводник с инверсионным |
|
||||||
6 |
8. |
сл о ем -С ........................ |
. . . |
. |
........................263 |
||||
Квантовые эффекты и диссипация в джозефсоновских переходах ма |
266 |
||||||||
6 9 |
|
лых |
р азм ер о в ............................................................. |
|
|
• |
|
||
|
Токоперенос в туннельных джозефсоновских переходах малых раз |
287 |
|||||||
|
|
меров с |
вихрями А брикосова................................ |
|
. . . |
|
|||
Заключение...................................... |
................................................288 |
||||||||
Список литературы ................................................................... |
|
|
• |
|
289 |
The problems of correlation between electrophysical characteristics and phy sical parameters of microstructures at semiconductors and superconductors such as surface barrier structures (melal-n-(p)-semiconductor, metal-p+ (n [ )-n(p)-semi conductor, metaltunnel dielectric-semiconductor), semiconductor structures with alternating layers which have potential barrier and quantum well system (two-, mullibarrier structures, superlattices), superconductor-insulator (or normal metal, semiconductor)-superconductor structures and periodic structures based on them with Josephson coupling between the layers are discussed.
The description and critical comments of the basic principles of physics, mic rotechnology and application ot the microstructures at elemental semiconductors, semiconductor compounds and high temperature superconductors in the devices and superhigh speed VLSI’s are given.
The monograph is aimed at the scientists specialized in microelectronics and semiconductor, superconductor devices.
CONTENTS |
|
|
|
|
|
|
||
Preface |
. |
................................................................................... |
3 |
|||||
P a r t |
I SEMICONDUCTOR SURFACE BARRIER STRUCTURES . . |
4 |
||||||
Chapter |
1. Metal-semiconductor |
(MS) |
Schottky barrier |
structures |
|
5 |
||
1 1. |
Potential barrier |
formation |
in |
metal-semiconductor |
structure |
. |
5 |
|
1.2. Current transport mechanisms in the metal-crystalline semiconductor |
13 |
|||||||
1.3. |
structures . . . |
. |
|
. . . . . . . . |
|
|||
Current transport |
mechanisms in the metal-amorphous semiconductor |
|
1 |
4. |
s tru c tu re s ...................................... |
....................................19 |
|
||
Specifity of the barrier formation and current |
transport in the |
metal- |
32 |
|||
1 |
5 |
semiconductor compound stru ctu res............................................................ |
|
an alternating signal |
||
Effects in the metal-semiconductor structures at |
37 |
|||||
16 |
|
Proscsses in the ohmic MS stru c tu re s ....................... |
|
. . |
. |
41 |
1 |
7. Effects in the MS structures underillum ination...................................... |
|
43 |
|||
1.8. Noise in the MS structures ................................................................. |
|
|
. . |
hi |
||
1.9 |
|
Fundamental physical size limitations of the MS structures |
54 |
|||
1 |
10 Processes in the MS structures associated |
with |
size reduction |
. . |
57 |
|
111. Physical principles of MS structureapplications...................................... |
|
59 |
||||
Chapter 2. Metal-n-(p)-n+(p+)-semiconductor and metabn+(p+)-p(n)-semi |
51 |
|||||
|
|
conductor stru ctu res........................................................................ |
|
|
|
|
2 |
1. |
Potential profile and current transport in |
the |
M-n(p)-n+(p+)-S |
Mott |
|
2.2. |
barrier stru c tu re s .............................................................................. |
|
|
|
|
|
Barrier formation and current transport in the Mn^(p+)-p(n)-S struc |
|
|||||
2 |
3 |
tures ............................................ |
.......................................... |
|
||
Minority carrier injection in the M-p1-n-S |
s tru c tu re ..................... |
|
|
2 |
4 Space charge region properties |
and current transport in the M-p+-n-S |
||
2.5 |
structure with deep levels in the |
semiconductor............................. |
69 |
|
C-V characteristic of the M-p^-n-'S |
structure with deep levels in the |
se |
||
2 |
miconductor . . . . |
. . . |
................................... 77 |
|
b, Simulation of the characteristics |
for the |
M-p+-n-S structure |
with |
|
2.7 |
planar nonuniform p ro p e rtie s |
.................................................................. |
|
78 |
Space charge region parameter evaluation |
for the M-n(n+)-n+ (n)-S |
|||
|
structures........................................................... |
|
|
87 |
2.8C-V characteristic of the M-n+-n-S structure with varied impurity
2 9. |
|
distribution |
in thesemiconductor.............................................................. |
|
|
|
|
90 |
|||
|
Limitations |
ofminimal |
structure sizes |
|
|
|
ele |
91 |
|||
2.10. Effectiveness of the structure applications in the microelectronic |
92 |
||||||||||
|
|
ments |
|
. |
. |
. |
. . . |
|
. . . |
. |
|
Chapter 3. Metal-thin dielectric-semiconductor |
tunnel structures |
. . |
. |
93 |
|||||||
3 1 |
2 |
Barrier formation in the semiconductor space charge |
region |
. . |
95 |
||||||
3 |
Recharge of the localized |
electronic states at the |
thin dielectric-seini- |
|
|||||||
3 |
3 |
conducor |
in te rfa c e .......................... |
|
|
........................................ 100 |
|
||||
Parameter |
characterization for the space charge region with a |
semi |
102 |
||||||||
3 |
4. |
conductor |
inversion layer |
|
|
|
|
|
|||
Parameter characterization for the space charge region in the semicon |
105 |
||||||||||
3.5. |
|
ductor with |
a graded |
gap |
l a y e r ........................................................... |
|
|
|
|
||
|
Parameter calculation for the space charge region in the semiconduc |
108 |
|||||||||
|
|
tor with |
an |
accumulation |
l a y e r ............................................................ |
|
|
|
|
3.6Current transport mechanisms in the metal-thin dielectric-semiconduc
|
|
tor Schottky barrier stru c tu re s .............................. |
|
|
|
|
|
|
. . . . |
|
112 |
||||||||||
3.7. Carrier tunneling |
through the thin dielectric and space |
charge region |
121 |
||||||||||||||||||
3.8. |
barriers assisted by the surface |
slates . |
barrier of |
. |
. |
dielectric |
|||||||||||||||
Carrier tunneling |
through |
a |
complicated |
the |
thin |
122 |
|||||||||||||||
3 |
9. Charge |
transfer through |
an |
osciliating |
potential |
barrier |
. . |
. |
124 |
||||||||||||
3 10 |
Current |
transport |
in the |
metal-thin dielectricamorphous |
semiconductor |
127 |
|||||||||||||||
3.11 |
s tr u c tu r e s ........................................................ |
|
|
|
|
|
|
|
|
|
|
. |
|
. |
|
||||||
Tunneling conductivity oscillations of the M-thin dielectrics |
structures |
129 |
|||||||||||||||||||
3 12. |
in |
the |
quantized |
magnetic |
fields |
. |
|
|
|
. . . . |
|
. |
|||||||||
Processes in the metal-thin dielectric-semiconductor structures due |
to |
131 |
|||||||||||||||||||
3 13 |
minority |
carrier injection |
|
|
|
|
|
|
|
|
|
|
|
|
|
||||||
Optical effects in the metal-thin dielectric-semiconductor structures |
|
133 |
|||||||||||||||||||
3 14. Coherent |
|
one-electron phenomena |
in the |
metal-thin dielectric-semicon |
|
||||||||||||||||
3 15 |
ductor |
microand |
submicrostructures |
|
|
. |
|
..............................138 |
|||||||||||||
Mesoscopies of the metal-thin |
dielectric-semiconductor |
structures |
|
143 |
|||||||||||||||||
316. |
Physical principles of the metal-thin dielectric-semiconductor based |
|
|||||||||||||||||||
|
|
elements |
|
. |
|
. |
|
|
........................................................... 144 |
||||||||||||
P a r t |
IL |
SEMICONDUCTOR STRUCTURES |
WITH THE |
MULTIPLE |
147 |
||||||||||||||||
|
|
|
|
POTENTIAL BARRIER ANDQUANTUM WELL SUSTEMS |
|
||||||||||||||||
Chapter |
4. |
Single and |
coupled |
|
quantum |
well |
structures |
|
. . . |
|
148 |
||||||||||
4.1. |
Energy hand model of the single quantum |
well structure . . |
. |
149 |
|||||||||||||||||
4 2. |
|
Electron-electron interaction and interlevel transitions in |
the |
quantum |
|
||||||||||||||||
4 |
3. |
w e ll ....................................... |
|
|
|
|
|
|
|
|
well |
e x c ito n |
|
|
|
. 1 5 1 |
|||||
Quasi-two-dimensional quantum |
|
|
|
|
15.3 |
||||||||||||||||
4 |
4 |
Spin |
relaxation |
of the |
quantum welle le c tro n s |
................................... |
|
|
|
155 |
|||||||||||
4 |
5 |
Piocesses of the nonequilibrium carrier transitions quantum wcllsemi- |
15.8 |
||||||||||||||||||
4.6. |
|
conductor |
for an |
inverse |
|
quantum |
well |
population . . |
|
||||||||||||
|
Conditions |
|
|
162 |
|||||||||||||||||
4.7. |
Nonlinear |
absorption spectrum |
in |
the |
structures with quantum well |
170 |
|||||||||||||||
4.8. |
|
subband |
f illin g .......................................................................................... |
|
|
the |
quantum |
well |
structures . . . |
|
|||||||||||
|
Electrooptic modulation in |
|
173 |
||||||||||||||||||
4.9. |
|
Quantum |
well screening |
at |
the |
charge |
|
tiansfer |
|
. . . . |
. |
177 |
|||||||||
4 |
10.Electron |
resonant |
tunneling through the multiple barrier system |
180 |
|||||||||||||||||
4.11. Electron resonant |
tunneling |
assisted by |
a |
quantum |
well |
level . |
. |
183 |
4.12. Development mechanism |
of the S-type negative differential conducti |
195 |
|||||||||||||||||||||
4 |
|
vity |
in |
the |
multilayer |
structures............................................................. |
|
|
waves |
along |
|
the |
quantum |
||||||||||
13 Effects |
in |
the |
structures |
with |
electron |
|
196 |
||||||||||||||||
4 14. |
w |
e l l s |
.......................................................... |
|
|
|
|
|
|
|
|
w |
e l l s |
|
|
|
|
|
|
||||
Stark effect in the coupled quantum |
|
|
|
|
|
|
198 |
||||||||||||||||
4 15. |
Multifunctionality of the quantumwell andbarrier based element* |
|
200 |
||||||||||||||||||||
Chapter |
5. |
Superlattices................................................................................... |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
203 |
||||||
5 1. |
|
Superlaitice |
energy band |
model |
|
|
|
|
|
|
|
m |
the |
su |
203 |
||||||||
5.2. |
|
Collective two-dimensional electron (hole) gas excitations |
214 |
||||||||||||||||||||
5 |
3 |
perlattices ................................................................................................... |
|
|
|
|
|
|
transfer |
in the |
superlattice* . |
. |
|||||||||||
Quantum effects of the charge |
215 |
||||||||||||||||||||||
5.4. Bistability of the resonant-tunneling electron current in the supeilattices |
218 |
||||||||||||||||||||||
5.5. |
Superlattice |
kinetic effects |
in |
the high |
electric |
fields . |
|
|
. . |
. |
221 |
||||||||||||
5.6. |
|
Superlattice |
kinetic effects |
in |
the quantized magnetic |
field |
|
224 |
|||||||||||||||
5 |
7. Electrostatic modes in the superlatiices............................. |
|
|
|
|
|
. |
. |
225 |
||||||||||||||
5 |
8. |
Magnetostatic |
modes |
in |
the superlatiices . . . . |
|
|
|
. |
229 |
|||||||||||||
5.9. |
|
Effects in spin superlattices |
, |
|
and applications |
|
|
|
. |
. |
231 |
||||||||||||
5 10. Quasi atomic superlaitice properties |
for |
|
234 |
||||||||||||||||||||
5.11. |
Physical principles |
of superlaitice |
element |
creation |
mit ro(nano) |
235 |
|||||||||||||||||
|
|
e le c tro n ic s ................................................................... |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
. |
|
|||||
P a r t |
III |
SUPERCONDUCTOR |
STRUCTURES |
. |
|
|
|
. . |
. |
242 |
|||||||||||||
Chapter 6. Superconductor-interlayer-superconductor structures (SIS) |
. . |
242 |
|||||||||||||||||||||
6.1. |
Josephson |
junction p h y s ic s .................................................................... |
the |
magnetic fields . . |
|
. |
242 |
||||||||||||||||
6 2 |
|
Josephson junction processes |
in |
|
245 |
||||||||||||||||||
6.3. |
Quantum intcrfeience |
effect |
irithe Josephson |
junctions |
*tiuctme |
|
249 |
||||||||||||||||
6 |
4 Currc'4 transport in |
the Josephson |
junction |
under the |
influence of an |
250 |
|||||||||||||||||
6.5 |
|
electromagnetic |
field. |
Norisiationai y |
Josephson effect |
|
|
. |
. |
||||||||||||||
|
Nonequilibrimn |
effects |
at |
the |
current |
transport |
in SIS's . . |
. |
251 |
||||||||||||||
6 |
|
the |
current |
transport |
|
. . . |
|
|
|
. . . |
|
. |
|
|
. |
|
259 |
||||||
6. Effects |
in |
superconductor semiconducloi -superconductor |
shuotures at |
259 |
|||||||||||||||||||
6 |
7 |
ihe current |
transport. |
|
. . . |
|
|
|
. . . |
|
|
|
. . . |
. |
|||||||||
|
Josephson current in the superconductor-semiconductor |
inversion |
layer- |
263 |
|||||||||||||||||||
6 |
|
superconductor |
structures |
|
|
m |
. |
|
|
. |
|
|
. . . |
. |
|||||||||
8Quantum effects |
and |
dissipation |
the small |
Josephson |
junctions |
|
266 |
||||||||||||||||
ê.9 |
Current |
transport in |
the |
small |
Josephson junctions with Abrikosov |
287 |
|||||||||||||||||
|
|
vortices |
. . . |
|
|
. |
|
. |
|
|
. . . . |
|
|
|
. |
. |
|||||||
S u m m ary ........................................... |
|
|
|
|
|
|
|
|
|
|
|
|
. |
|
|
|
. . |
. |
288 |
||||
B ibliography........................................... |
|
|
|
|
|
|
|
|
|
|
|
. |
|
|
|
. . |
. |
289 |